Vlsi Electronics Microstructure Science Ser.: VLSI Electronics: Microstructure Vol. 22 by Anant G. Sabnis (1990, Hardcover)
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About this product
Product Identifiers
PublisherElsevier Science & Technology Books
ISBN-100122341228
ISBN-139780122341229
eBay Product ID (ePID)40647
Product Key Features
Number of Pages207 Pages
LanguageEnglish
Publication NameVlsi Electronics: Microstructure Vol. 22
Publication Year1990
SubjectIndustrial Design / Product, Electronics / Circuits / Vlsi & Ulsi, Electronics / Circuits / General, Production & Operations Management
TypeTextbook
AuthorAnant G. Sabnis
Subject AreaTechnology & Engineering, Business & Economics
SeriesVlsi Electronics Microstructure Science Ser.
FormatHardcover
Dimensions
Item Weight16.3 Oz
Item Length9.4 in
Item Width6.3 in
Additional Product Features
Intended AudienceScholarly & Professional
LCCN89-017892
ReviewsDr. Sabnis has provided a broad overview of the major failure mechanisms afflicting modern semiconductor devices, and he has compiled a carefully selected list of references for each subject. He has also summarized many of the methods developed over time to evaluate reliability of these devices. I strongly recommend this book to all those*bMboth neophytes and experts*bMinvolved in the design, fabrication, and application of integrated circuits. --From the Foreword by Carl W. Green, Head, IC Test Technology, AT&T Bell Laboratories
Dewey Edition20
Series Volume NumberVolume 22
Volume NumberVolume 22
IllustratedYes
Dewey Decimal621.39/5 s
Table Of ContentIntroduction. Reliability Concepts and Modeling. Electrostatic Discharge Damage. Metal Electromigration. Dielectric Breakdown. Instabilities in ICs. Packaging Related Reliability Issues. Reliability Assurance and Qualification. Each chapter includes references. Index.
SynopsisMost of the literature on the subject of IC reliability emphasizes the theoretical aspects. This book offers managers and engineers insight into th practical aspects of VLSI reliability, from basic concepts to packaging issu Other topics covered include failure analysis techniques, radiation effect, As integrated cicuits become more complex, with smaller and smaller geometries, much more care must be taken to avoid reliability problems. This practical volume covers a broad spectrum of reliability issues in integrated circuits, from basic concepts to packaging.
LC Classification NumberTK7874.V56 vol. 22
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