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Testing of Digital Systems by Gupta, S. Hardback Book The Fast Free Shipping
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eBay item number:394779189580
Item specifics
- Condition
- ISBN
- 0521773563
- EAN
- 9780521773560
- Release Title
- Testing of Digital Systems
- Artist
- Gupta, S.
- Brand
- N/A
- Colour
- N/A
- Book Title
- Testing of Digital Systems
- Subject Area
- Computers
- Publication Name
- Testing of Digital Systems
- Item Length
- 10.1 in
- Publisher
- Cambridge University Press
- Subject
- Computer Engineering
- Publication Year
- 2003
- Type
- Textbook
- Format
- Hardcover
- Language
- English
- Item Height
- 1.9 in
- Item Width
- 7.1 in
- Item Weight
- 77.1 Oz
- Number of Pages
- 1016 Pages
About this product
Product Information
Device testing represents the single largest manufacturing expense in the semiconductor industry, costing over $40 billion a year. The most comprehensive and wide ranging book of its kind, Testing of Digital Systems covers everything you need to know about this vitally important subject. Starting right from the basics, the authors take the reader through automatic test pattern generation, design for testability and built-in self-test of digital circuits before moving on to more advanced topics such as IDDQ testing, functional testing, delay fault testing, memory testing, and fault diagnosis. The book includes detailed treatment of the latest techniques including test generation for various fault models, discussion of testing techniques at different levels of integrated circuit hierarchy and a chapter on system-on-a-chip test synthesis. Written for students and engineers, it is both an excellent senior/graduate level textbook and a valuable reference.
Product Identifiers
Publisher
Cambridge University Press
ISBN-10
0521773563
ISBN-13
9780521773560
eBay Product ID (ePID)
1682845
Product Key Features
Publication Name
Testing of Digital Systems
Format
Hardcover
Language
English
Subject
Computer Engineering
Publication Year
2003
Type
Textbook
Subject Area
Computers
Number of Pages
1016 Pages
Dimensions
Item Length
10.1 in
Item Height
1.9 in
Item Width
7.1 in
Item Weight
77.1 Oz
Additional Product Features
LCCN
2003-277476
Intended Audience
Scholarly & Professional
Lc Classification Number
Tk7874.65 .J43 2003
Table of Content
1. Introduction; 2. Fault models; 3. Combinational logic and fault simulation; 4. Test generation for combinational circuits; 5. Sequential ATPG; 6. IDDQ testing; 7. Functional testing; 8. Delay fault testing; 9. CMOS testing; 10. Fault diagnosis; 11. Design for testability; 12. Built-in self-test; 13. Synthesis for testability; 14. Memory testing; 15. High-level test synthesis; 16. System-on-a-chip testing; Index.
Copyright Date
2002
Dewey Decimal
621.381548
Dewey Edition
21
Illustrated
Yes
Item description from the seller
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- GB 922696893
Seller assumes all responsibility for this listing.
eBay item number:394779189580
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