Picture 1 of 1
Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents: New
Condition:
Postage:
Located in: Sparks, Nevada, United States
Delivery:
Estimated between Thu, 27 Jun and Tue, 2 Jul to 43230
Returns:
Coverage:
Read item description or contact seller for details. See all detailsSee all details on coverage
(Not eligible for eBay purchase protection programmes)
Shop with confidence
Seller information
- 98.5% positive feedback
Registered as a Business Seller
Seller assumes all responsibility for this listing.
eBay item number:282828826196
Item specifics
- Condition
- Brand New: A new, unread, unused book in perfect condition with no missing or damaged pages. See all condition definitionsopens in a new window or tab
- Book Title
- Scanning Probe Microscopy: Atomic Scale Engineering by Forces and
- Publication Date
- 2006-06-28
- Pages
- 282
- ISBN
- 9780387400907
- Subject Area
- Technology & Engineering, Science
- Publication Name
- Scanning Probe Microscopy : Atomic Scale Engineering by Forces and Currents
- Publisher
- Springer New York
- Item Length
- 9.3 in
- Subject
- Nanoscience, Materials Science / General, Electron Microscopes & Microscopy, Nanotechnology & Mems
- Publication Year
- 2006
- Series
- Nanoscience and Technology Ser.
- Type
- Textbook
- Format
- Hardcover
- Language
- English
- Item Weight
- 46.2 Oz
- Item Width
- 6.1 in
- Number of Pages
- Xiv, 282 Pages
About this product
Product Information
Scanning Probe Microscopy is a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory. Writing in a tutorial style, the authors explain from scratch the theory behind today's simulation techniques and give examples of theoretical concepts through state-of-the-art simulations, including the means to compare these results with experimental data. The book provides the first comprehensive framework for electron transport theory with its various degrees of approximations, thus allowing extensive insight into the physics of scanning probes. Experimentalists will appreciate how the materials properties influence the instrument's operation, and theorists will understand how simulations can be directly compared to experimental data. Key Features Serves as a comprehensive source of information for researchers, teachers, and students about the theory underlying the rapidly expanding field of scanning probe microscopy Provides a framework for linking scanning probe theory and simulations with experimental data Written in the style of a textbook with step-by-step examples of how theoretical concepts are used to generate state-of-the-art simulations
Product Identifiers
Publisher
Springer New York
ISBN-10
0387400907
ISBN-13
9780387400907
eBay Product ID (ePID)
48248759
Product Key Features
Number of Pages
Xiv, 282 Pages
Language
English
Publication Name
Scanning Probe Microscopy : Atomic Scale Engineering by Forces and Currents
Publication Year
2006
Subject
Nanoscience, Materials Science / General, Electron Microscopes & Microscopy, Nanotechnology & Mems
Type
Textbook
Subject Area
Technology & Engineering, Science
Series
Nanoscience and Technology Ser.
Format
Hardcover
Dimensions
Item Weight
46.2 Oz
Item Length
9.3 in
Item Width
6.1 in
Additional Product Features
Intended Audience
Scholarly & Professional
LCCN
2005-936713
Dewey Edition
22
Number of Volumes
1 Vol.
Illustrated
Yes
Dewey Decimal
502.8/2
Lc Classification Number
Ta418.5-.84
Table of Content
The Physics of Scanning Probe Microscopes.- SPM: The Instrument.- Theory of Forces.- Electron Transport Theory.- Transport in the Low Conductance Regime.- Bringing Theory to Experiment in SFM.- Topographic images.- Single-Molecule Chemistry.- Current and Force Spectroscopy.- Outlook.
Copyright Date
2006
Item description from the seller
Seller assumes all responsibility for this listing.
eBay item number:282828826196
Postage and handling
Item location:
Sparks, Nevada, United States
Post to:
Albania, Andorra, Angola, Anguilla, Antigua and Barbuda, Argentina, Armenia, Aruba, Australia, Austria, Azerbaijan Republic, Bahamas, Bahrain, Bangladesh, Belgium, Belize, Benin, Bermuda, Bhutan, Bolivia, Bosnia and Herzegovina, Botswana, Brunei Darussalam, Bulgaria, Burkina Faso, Burundi, Cambodia, Cameroon, Canada, Cape Verde Islands, Cayman Islands, Central African Republic, Chad, Chile, China, Colombia, Costa Rica, Cyprus, Czech Republic, Côte d'Ivoire (Ivory Coast), Democratic Republic of the Congo, Denmark, Djibouti, Dominican Republic, Ecuador, Egypt, El Salvador, Equatorial Guinea, Eritrea, Estonia, Ethiopia, Fiji, Finland, France, Gabon Republic, Gambia, Georgia, Germany, Ghana, Gibraltar, Greece, Greenland, Grenada, Guatemala, Guinea, Guyana, Haiti, Honduras, Hong Kong, Hungary, Iceland, India, Indonesia, Ireland, Israel, Italy, Jamaica, Japan, Jordan, Kazakhstan, Kenya, Kiribati, Kuwait, Kyrgyzstan, Laos, Latvia, Lebanon, Lesotho, Liechtenstein, Lithuania, Luxembourg, Macau, Macedonia, Madagascar, Malawi, Malaysia, Maldives, Mali, Malta, Mauritania, Mauritius, Mexico, Moldova, Monaco, Mongolia, Montenegro, Montserrat, Morocco, Mozambique, Namibia, Nauru, Nepal, Netherlands, New Zealand, Nicaragua, Niger, Norway, Oman, Pakistan, Panama, Papua New Guinea, Paraguay, Peru, Philippines, Poland, Portugal, Qatar, Republic of Croatia, Republic of the Congo, Romania, Rwanda, Saint Kitts-Nevis, Saint Lucia, Saint Vincent and the Grenadines, San Marino, Saudi Arabia, Senegal, Serbia, Seychelles, Sierra Leone, Singapore, Slovakia, Slovenia, Solomon Islands, South Africa, South Korea, Spain, Sri Lanka, Suriname, Swaziland, Sweden, Switzerland, Taiwan, Tajikistan, Tanzania, Thailand, Togo, Tonga, Trinidad and Tobago, Tunisia, Turkey, Turkmenistan, Turks and Caicos Islands, Uganda, United Arab Emirates, United Kingdom, United States, Uruguay, Uzbekistan, Vanuatu, Vatican City State, Vietnam, Wallis and Futuna, Western Samoa, Yemen, Zambia, Zimbabwe
Excludes:
APO/FPO, Afghanistan, Alaska/Hawaii, Algeria, Barbados, Belarus, Brazil, French Guiana, French Polynesia, Guadeloupe, Guinea-Bissau, Iraq, Liberia, Libya, Martinique, New Caledonia, Nigeria, Reunion, Russian Federation, US Protectorates, Ukraine, Venezuela
| Postage and handling | To | Service | Delivery*See Delivery notes |
|---|---|---|---|
| Free postage | United States | Standard Shipping | Estimated between Thu, 27 Jun and Tue, 2 Jul to 43230 |
| US $5.50 (approx RM 25.92) | United States | Expedited Shipping | Estimated between Wed, 26 Jun and Fri, 28 Jun to 43230 |
| Handling time |
|---|
| Will usually post within 2 business days of receiving cleared payment. |
| Taxes |
|---|
| Seller charges sales tax in |
Sales Tax for an item #282828826196
Sales Tax for an item #282828826196
Seller collects sales tax for items shipped to the following states:
| State | Sales Tax Rate |
|---|
Return policy
| After receiving the item, contact seller within | Refund will be given as |
|---|---|
| 30 days | Money Back |
The buyer is responsible for return postage costs.
Seller feedback (463,332)
f***b (240)- Feedback left by buyer.
Past month
Verified purchase
Didn't ship from where it said it would.
f***b (240)- Feedback left by buyer.
Past month
Verified purchase
Didn't ship from where it said it would.
f***b (240)- Feedback left by buyer.
Past month
Verified purchase
Didn't ship from where it said it would.
More to explore :
- News Magazines,
- New Magazines,
- New Yorker Magazines,
- Current Affairs Hardcover Nonfiction Books,
- Nonfiction Books Fiction & Current Affairs,
- Transportation Air Force Nonfiction Books & Fiction,
- New Yorker News Magazines,
- Sporting News Magazines,
- History Nonfiction Air Force Fiction & Nonfiction Books,
- News Weekly Magazines