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Introduction To Focused Ion Beams: Instrumentatio
US $199.99
ApproximatelyRM 845.10
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Condition:
Like New
A book in excellent condition. Cover is shiny and undamaged, and the dust jacket is included for hard covers. No missing or damaged pages, no creases or tears, and no underlining/highlighting of text or writing in the margins. May be very minimal identifying marks on the inside cover. Very minimal wear and tear.
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Located in: Ponca City, Oklahoma, United States
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Estimated between Thu, 23 Oct and Mon, 27 Oct to 94104
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eBay item number:276531785051
Item specifics
- Condition
- Book Title
- Introduction To Focused Ion Beams: Instrumentation, Theory, ...
- ISBN
- 9780387231167
About this product
Product Identifiers
Publisher
Springer
ISBN-10
0387231161
ISBN-13
9780387231167
eBay Product ID (ePID)
44118264
Product Key Features
Number of Pages
Xvii, 357 Pages
Language
English
Publication Name
Introduction to Focused Ion Beams : Instrumentation, Theory, Techniques and Practice
Subject
Physics / Condensed Matter, Materials Science / Thin Films, Surfaces & Interfaces, Materials Science / Electronic Materials, Physics / Nuclear
Publication Year
2004
Type
Textbook
Subject Area
Technology & Engineering, Science
Format
Hardcover
Dimensions
Item Weight
55 Oz
Item Length
9.3 in
Item Width
6.1 in
Additional Product Features
Intended Audience
Scholarly & Professional
LCCN
2004-056559
Dewey Edition
22
Number of Volumes
1 vol.
Illustrated
Yes
Dewey Decimal
621.3815/2
Table Of Content
The Focused Ion Beam Instrument.- Ion - Solid Interactions.- Focused Ion Beam Gases for Deposition and Enhanced Etch.- Three-Dimensional Nanofabrication Using Focused Ion Beams.- Device Edits and Modifications.- The Uses of Dual Beam FIB in Microelectronic Failure Analysis.- High Resolution Live Imaging of FIB Milling Processes for Optimum Accuracy.- FIB for Materials Science Applications - a Review.- Practical Aspects of FIB Tem Specimen Preparation.- FIB Lift-Out Specimen Preparation Techniques.- A FIB Micro-Sampling Technique and a Site Specific TEM Specimen Preparation Method.- Dual-Beam (FIB-SEM) Systems.- Focused Ion Beam Secondary Ion Mass Spectrometry (FIB-SIMS).- Quantitative Three-Dimensional Analysis Using Focused Ion Beam Microscopy.- Application of FIB in Combination with Auger Electron Spectroscopy.
Synopsis
Introduction to Focused Ion Beams is geared towards techniques and applications. This is the only text that discusses and presents the theory directly related to applications and the only one that discusses the vast applications and techniques used in FIBs and dual platform instruments., Introduction to Focused Ion Beams is geared towards techniques and applications. The first portion of this book introduces the basics of FIB instrumentation, milling, and deposition capabilities. The chapter dedicated to ion-solid interactions is presented so that the FIB user can understand which parameters will influence FIB milling behavior. The remainder of the book focuses on how to prepare and analyze samples using FIB and related tools, and presents specific applications and techniques of the uses of FIB milling, deposition, and dual platform techniques. This is the only text that discusses and presents the theory directly related to applications and the only one that discusses the vast applications and techniques used in FIBs and Dual platform instruments
LC Classification Number
QC173.45-173.458
Item description from the seller
Seller feedback (144)
- t***s (11)- Feedback left by buyer.Past yearVerified purchaseItem arrived in good condition as advertised.Basic Health Physics by Bevelacqua, Joseph John (#276696336694)
- h***9 (10)- Feedback left by buyer.More than a year agoVerified purchaseItem was received just as advertised.TSI VelociCheck Model 8330 Air Velocity Model, Tested (#274391759406)
- 0***m (126)- Feedback left by buyer.More than a year agoVerified purchaseCame with certificate and was as described.NIST Standard Reference Material 629 Zinc-Based E Die Cast Alloy (#274819561693)
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Seller feedback (144)
- t***s (11)- Feedback left by buyer.Past yearVerified purchaseItem arrived in good condition as advertised.Basic Health Physics by Bevelacqua, Joseph John (#276696336694)
- h***9 (10)- Feedback left by buyer.More than a year agoVerified purchaseItem was received just as advertised.TSI VelociCheck Model 8330 Air Velocity Model, Tested (#274391759406)
- 0***m (126)- Feedback left by buyer.More than a year agoVerified purchaseCame with certificate and was as described.NIST Standard Reference Material 629 Zinc-Based E Die Cast Alloy (#274819561693)