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Metrology, Inspection, and Process Control for Microlithograp hy XIX Brand New!
US $125.00
ApproximatelyRM 517.15
or Best Offer
Condition:
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Shipping:
US $9.97 (approx RM 41.25) Economy Shipping.
Located in: Kutztown, Pennsylvania, United States
Delivery:
Estimated between Tue, 2 Dec and Sat, 6 Dec to 94104
Returns:
30 days return. Buyer pays for return shipping. If you use an eBay shipping label, it will be deducted from your refund amount.
Coverage:
Read item description or contact seller for details. See all detailsSee all details on coverage
(Not eligible for eBay purchase protection programmes)
About this item
Seller assumes all responsibility for this listing.
eBay item number:265946264565
Item specifics
- Condition
- Brand New: A new, unread, unused book in perfect condition with no missing or damaged pages. See all condition definitionsopens in a new window or tab
- Publication Year
- 2005
- Format
- Trade Paperback
- Language
- English
- Book Title
- Proceedings of SPIE
- Publisher
- International Society for Optical Engineering
- Genre
- Science
- Topic
- Optical Engineering
- ISBN
- 0819457329
Item description from the seller
Seller feedback (1,222)
- r***u (486)- Feedback left by buyer.Past 6 monthsVerified purchaseVintage book arrived safe and sound, well packaged, thank you for that. As described for a good value. I had a question about the book and it was promptly answered. Great seller. 120/500
- h***c (906)- Feedback left by buyer.Past 6 monthsVerified purchaseExcellent transaction, fast shipment, secure packing, friendly communication. Highly recommended seller. Thanks again!
- d***4- Feedback left by buyer.Past 6 monthsVerified purchaseFast shipping, pack well, as described, great value. Cheers

